Ahn; Sang Jung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ahn; Sang Jung.The latest application filed is for "particle beam mass spectrometer and particle measurement method by means of same".

Company Profile

2.11.11

Ahn; Sang Jung - Busan KR
Ahn; Sang Jung - Daejeon KR
Ahn; Sang-Jung - Taejon KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probes for identifying geographical distribution and molecular epidemiology of viral hemorrhagic septicemia virus (VHSV) and uses thereof Grant 10,557,178 - Cho , et al. Feb	2020-02-11
Sample chamber device for electron microscope, and electron microscope comprising same Grant 10,312,049 - Cho , et al.	2019-06-04
Particle beam mass spectrometer and particle measurement method by means of same Grant 10,283,339 - Park , et al.	2019-05-07
Particle Beam Mass Spectrometer And Particle Measurement Method By Means Of Same App 20180286655 - Park; Chang Joon ; et al.	2018-10-04
Sample Chamber Device For Electron Microscope, And Electron Microscope Comprising Same App 20180158645 - CHO; Bok Lae ; et al.	2018-06-07
Probes For Identifying Geographical Distribution And Molecular Epidemiology Of Viral Hemorrhagic Septicemia Virus (vhsv) And Uses Thereof App 20180155799 - Cho; Miyoung ; et al.	2018-06-07
Ion source, and mass analysis apparatus including same Grant 9,673,035 - Park , et al. June 6, 2	2017-06-06
Monochromator and charged particle apparatus including the same Grant 9,425,022 - Ogawa , et al. August 23, 2	2016-08-23
Ion Source, And Mass Analysis Apparatus Including Same App 20160225600 - PARK; Chang Joon ; et al.	2016-08-04
Monochromator And Charged Particle Apparatus Including The Same App 20150371811 - OGAWA; Takashi ; et al.	2015-12-24
Substrate measurement apparatus with electron distortion unit Grant 9,009,861 - Park , et al. April 14, 2	2015-04-14
Movement-free bending method for one-dimensional or two-dimensional nanostructure using ion beam Grant 8,859,999 - Kim , et al. October 14, 2	2014-10-14
Fusion Measurement Apparatus App 20140130212 - Park; Byong Chon ; et al.	2014-05-08
Movement-free Bending Method For One-dimensional Or Two-dimensional Nanostructure Using Ion Beam App 20140110608 - Kim; Dal Hyoun ; et al.	2014-04-24
Apparatus and method for repairing photo mask Grant 8,153,338 - Park , et al. April 10, 2	2012-04-10
Apparatus and method for repairing photo mask App 20110027698 - Park; Byong Chon ; et al.	2011-02-03
Method for fabricating SPM and CD-SPM nanoneedle probe using ion beam and SPM and CD-SPM nanoneedle probe thereby Grant 7,703,147 - Park , et al. April 20, 2	2010-04-20
Method For Fabricating Spm And Cd-spm Nanoneedle Probe Using Ion Beam And Spm And Cd-spm Nanoneedle Probe Thereby App 20090106869 - Park; Byong-Cheon ; et al.	2009-04-23
Deformation method of nanometer scale material using particle beam and nano tool thereby Grant 7,501,618 - Park , et al. March 10, 2	2009-03-10
Deformation Method Of Nanometer Scale Material Using Particle Beam And Nano Tool Thereby App 20080203295 - Park; Byong-Chon ; et al.	2008-08-28

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