Ahn; Kang Ho

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ahn; Kang Ho.The latest application filed is for "particle sampling probe and fine dust measuring device using same".

Company Profile

0.18.21

Ahn; Kang Ho - Seoul KR
Ahn; Kang Ho - Daechi-dong Gangnam-ku KR
Ahn; Kang Ho - Yongsan-Ku Seoul KR
Ahn; Kang-Ho - Gyeonggi-do KR
Ahn; Kang Ho - Ichon-dong Yongsan-ku KR
Ahn; Kang-Ho - 102-1504 Ichon Apt., Ichon-dong, Yongsan-gu Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Particle sampling probe and fine dust measuring device using same Grant 10,845,347 - Ahn November 24, 2	2020-11-24
Apparatus and system for classifying particles Grant 10,591,397 - Ahn	2020-03-17
Particle Sampling Probe And Fine Dust Measuring Device Using Same App 20180348096 - AHN; Kang Ho	2018-12-06
Particle Classification Device And Particle Classification System App 20180067034 - AHN; Kang Ho	2018-03-08
Condensation particle counter Grant 8,072,598 - Ahn December 6, 2	2011-12-06
Apparatus for manufacturing ultra-fine particles using corona discharge and method thereof Grant 7,972,567 - Ahn July 5, 2	2011-07-05
Soft X-ray Photoionization Charger App 20100135868 - Ahn; Kang-Ho ; et al.	2010-06-03
Condensation particle counter Grant 7,724,368 - Ahn May 25, 2	2010-05-25
Condensation particle counter Grant 7,719,683 - Ahn May 18, 2	2010-05-18
Particle measuring system and method Grant 7,605,910 - Ahn October 20, 2	2009-10-20
Method For Preparing Nanostructured Vanadia-titania Catalysts Useful For Degrading Chlorinated Organic Compounds By A Flame Spray Process App 20090054231 - Jurng; Jong Soo ; et al.	2009-02-26
Condensation Particle Counter App 20090009749 - AHN; KANG HO	2009-01-08
Condensation Particle Counter App 20090009748 - AHN; KANG HO	2009-01-08
Apparatus for measuring numbers of particles and method thereof Grant 7,471,076 - Ahn December 30, 2	2008-12-30
Apparatus and Method for Manufacturing Ultra-Fine Particles App 20080280068 - Ahn; Kang-Ho	2008-11-13
Condensation Particle Counter App 20080186489 - AHN; KANG HO	2008-08-07
Exhaust Unit, Exhausting Method, And Semiconductor Manufacturing Facility With The Exhaust Unit App 20080160905 - Kim; Moon-Jeong ; et al.	2008-07-03
Apparatus for manufacturing ultra-fine particles using electrospray device and method thereof Grant 7,347,679 - Ahn , et al. March 25, 2	2008-03-25
Particle Measuring System And Method App 20080047373 - Ahn; Kang Ho	2008-02-28
Apparatus for controlling flow rate of gases used in semiconductor device by differential pressure Grant 7,334,602 - Ahn February 26, 2	2008-02-26
Apparatus for Manufacturing Ultra-Fine Particles Using Corona Discharge and Method Thereof App 20070256922 - Ahn; Kang-Ho	2007-11-08
Apparatus for measuring numbers of particles and method thereof App 20070194775 - Ahn; Kang-Ho	2007-08-23
High flow particles atomizer App 20060163380 - Ahn; Kang-Ho	2006-07-27
Apparatus for controlling flow rate of gases used in semiconductor deivce by differential pressure App 20060151113 - Ahn; Kang-Ho	2006-07-13
Apparatus for manufacturing particles using corona discharge and method thereof App 20060072278 - Ahn; Kang-Ho ; et al.	2006-04-06
Condensation particle counter Grant 6,980,284 - Ahn , et al. December 27, 2	2005-12-27
Apparatus for manufacturing ultra-fine particles using electrospray device and method thereof App 20050139156 - Ahn, Kang Ho ; et al.	2005-06-30
Apparatus for manufacturing ultra-fine particles using electrospray device and method thereof Grant 6,860,434 - Ahn , et al. March 1, 2	2005-03-01
Condensation particle counter App 20040012772 - Ahn, Kang-Ho ; et al.	2004-01-22
Apparatus for manufacturing ultra-fine particles using electrospray device and method thereof App 20020158140 - Ahn, Kang Ho ; et al.	2002-10-31
Device for collecting dust using highly charged hyperfine liquid droplets Grant 6,471,753 - Ahn , et al. October 29, 2	2002-10-29
Method of particle analysis on a mirror wafer Grant 5,267,017 - Uritsky , et al. November 30, 1	1993-11-30

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