Ahn; Byung Il
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ahn; Byung Il.The latest application filed is for "drop mass deviation measuring apparatus, drop mass deviation measuring method of the same, pattern forming system using the same, and control method of the pattern forming system using the same".
- Ahn; Byung Il - Seoul KR
| Patent | Date |
|---|---|
| Drop mass deviation measuring apparatus, drop mass deviation measuring method of the same, pattern forming system using the same, and control method of the pattern forming system using the same Grant 8,170,827 - Kim , et al. May 1, 2 | 2012-05-01 |
| Drop mass deviation measuring apparatus, drop mass deviation measuring method of the same, pattern forming system using the same, and control method of the pattern forming system using the same App 20090164169 - Kim; Chong Uck ; et al. | 2009-06-25 |
| Transfer apparatus Grant 7,508,098 - Lee , et al. March 24, 2 | 2009-03-24 |
| Transporting apparatus Grant 7,255,478 - Ahn , et al. August 14, 2 | 2007-08-14 |
| Stage apparatus Grant 7,240,434 - Lee , et al. July 10, 2 | 2007-07-10 |
| Transfer apparatus App 20050184618 - Lee, Suk-won ; et al. | 2005-08-25 |
| Transporting apparatus App 20050180666 - Ahn, Byung-il ; et al. | 2005-08-18 |
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