Agnihotri; Dileep

Patent Applications and Registrations

Patent applications and USPTO patent grants for Agnihotri; Dileep.The latest application filed is for "integrated ultrafiltration and reverse osmosis desalination systems".

Company Profile

4.10.11

Agnihotri; Dileep - Round Rock TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Integrated ultrafiltration and reverse osmosis desalination systems Grant 10,583,401 - Agnihotri	2020-03-10
Membranes with polydopamine coatings Grant 10,518,226 - Agnihotri , et al. Dec	2019-12-31
Integrated Ultrafiltration And Reverse Osmosis Desalination Systems App 20150375174 - AGNIHOTRI; Dileep	2015-12-31
Membranes With Polydopamine Coatings App 20140054221 - Agnihotri; Dileep ; et al.	2014-02-27
Electrophoretic Deposition And Reduction Of Graphene Oxide To Make Graphene Film Coatings And Electrode Structures App 20110227000 - Ruoff; Rodney S. ; et al.	2011-09-22
Accurate measurement of layer dimensions using XRF Grant 7,804,934 - Agnihotri , et al. September 28, 2	2010-09-28
X-ray measurement of properties of nano-particles Grant 7,680,243 - Yokhin , et al. March 16, 2	2010-03-16
Automated selection of X-ray reflectometry measurement locations Grant 7,649,978 - Mazor , et al. January 19, 2	2010-01-19
Automated selection of x-ray reflectometry measurement locations App 20090074141 - Mazor; Isaac ; et al.	2009-03-19
Accurate Measurement Of Layer Dimensions Using Xrf App 20090074137 - Agnihotri; Dileep ; et al.	2009-03-19
X-ray measurement of properties of nano-particles App 20090067573 - Yokhin; Boris ; et al.	2009-03-12
Calibration of X-ray reflectometry system Grant 7,474,732 - Berman , et al. January 6, 2	2009-01-06
Accurate measurement of layer dimensions using XRF App 20080049895 - Agnihotri; Dileep ; et al.	2008-02-28
X-ray reflectometry of thin film layers with enhanced accuracy Grant 7,130,376 - Berman , et al. October 31, 2	2006-10-31
Material analysis using multiple X-ray reflectometry models Grant 7,103,142 - Agnihotri , et al. September 5, 2	2006-09-05
Material Analysis Using Multiple X-ray Reflectometry Models App 20060188062 - Agnihotri; Dileep ; et al.	2006-08-24
X-ray reflectometry of thin film layers with enhanced accuracy App 20060153333 - Berman; David ; et al.	2006-07-13
X-ray reflectometry of thin film layers with enhanced accuracy Grant 7,062,013 - Berman , et al. June 13, 2	2006-06-13
Calibration of X-ray reflectometry system App 20060115046 - Berman; David ; et al.	2006-06-01

Company Registrations

SEC

0001539807

Agnihotri Dileep

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