Aghajan; Hamid K.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Aghajan; Hamid K..The latest application filed is for "two-dimensional scatter plot technique for defect inspection".
- Aghajan; Hamid K. - Palo Alto CA
- Aghajan; Hamid K. - Stanford CA
| Patent | Date |
|---|---|
| Two-dimensional scatter plot technique for defect inspection Grant 6,912,304 - Aghajan June 28, 2 | 2005-06-28 |
| Adaptive mask technique for defect inspection Grant 6,614,924 - Aghajan September 2, 2 | 2003-09-02 |
| Automated direct patterned wafer inspection Grant 5,513,275 - Khalaj , et al. April 30, 1 | 1996-04-30 |
| Method of edge detection in optical images using neural network classifier Grant 5,311,600 - Aghajan , et al. May 10, 1 | 1994-05-10 |
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