Aeba; Hidetaka
Patent Applications and Registrations
Patent applications and USPTO patent grants for Aeba; Hidetaka.The latest application filed is for "fundus examination apparatus".
- Aeba; Hidetaka - Kita-ku JP
- Aeba; Hidetaka - Tokyo JP
- Aeba; Hidetaka - Itabashi-ku Tokyo 174-8580 JP
| Patent | Date |
|---|---|
| Fundus examination apparatus Grant 7,360,897 - Kikuta , et al. April 22, 2 | 2008-04-22 |
| Observation apparatus Grant 7,344,246 - Noda , et al. March 18, 2 | 2008-03-18 |
| Eye fundus photographing system Grant 7,258,442 - Noda , et al. August 21, 2 | 2007-08-21 |
| Fundus examination apparatus App 20060164598 - Kikuta; Hisao ; et al. | 2006-07-27 |
| Eye fundus photographing system App 20060139572 - Noda; Toru ; et al. | 2006-06-29 |
| Observation apparatus App 20050018134 - Noda, Toru ; et al. | 2005-01-27 |
| Apparatus for measurement of polarized distribution, polarizing filter for using therein and polarizing filter assembly Grant 6,814,441 - Ohnuma , et al. November 9, 2 | 2004-11-09 |
| Observation apparatus Grant 6,726,326 - Fukuma , et al. April 27, 2 | 2004-04-27 |
| Observation apparatus App 20030128333 - Fukuma, Yasufumi ; et al. | 2003-07-10 |
| Apparatus for measurement of polarized distribution, polarizing filter for using therein and polarizing filter assembly App 20030095233 - Ohnuma, Kazuhiko ; et al. | 2003-05-22 |
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