Advanced Mask Inspection Technology Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Advanced Mask Inspection Technology Inc..The latest application filed is for "pattern inspection apparatus and pattern inspection method".

Company Profile

0.23.41

Advanced Mask Inspection Technology Inc. - Yokohama-shi JP
Advanced Mask Inspection Technology Inc. - Kawasaki-shi JP
Advanced Mask Inspection Technology, Inc. - Kawasaki JP
Advanced Mask Inspection Technology Inc - Kawasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pattern Inspection Apparatus And Pattern Inspection Method App 20110229009 - ISOMURA; Ikunao ; et al.	2011-09-22
Pattern inspection apparatus, image alignment method, displacement amount estimation method, and computer-readable recording medium with program recorded thereon Grant 7,809,181 - Yamashita October 5, 2	2010-10-05
Image correction method and apparatus for use in pattern inspection system Grant 7,796,803 - Oaki September 14, 2	2010-09-14
Beam irradiation apparatus with deep ultraviolet light emission device for lithographic pattern inspection system Grant 7,781,749 - Imai August 24, 2	2010-08-24
Pattern inspection apparatus and method with enhanced test image correctability using frequency division scheme Grant 7,764,825 - Oaki July 27, 2	2010-07-27
Pattern inspection apparatus and method with local critical dimension error detectability Grant 7,756,318 - Nakatani July 13, 2	2010-07-13
Wavelength Conversion Light Source Apparatus And Wavelength Conversion Method App 20100128343 - IMAI; Shinichi ; et al.	2010-05-27
Image correcting method Grant 7,706,623 - Oaki April 27, 2	2010-04-27
Photomask Inspection Method App 20100074512 - HIRONO; Masatoshi	2010-03-25
Photomask inspection apparatus comparing optical proximity correction patterns to minimum and maximum limits Grant 7,664,308 - Isomura February 16, 2	2010-02-16
Pattern inspection apparatus Grant 7,656,516 - Imai February 2, 2	2010-02-02
Target workpiece inspection apparatus, image alignment method, and computer-readable recording medium with program recorded thereon Grant 7,655,904 - Yamashita February 2, 2	2010-02-02
Workpiece inspection apparatus, workpiece inspection method and computer-readable recording medium storing program Grant 7,643,668 - Nakatani January 5, 2	2010-01-05
Die-to-database photomask defect detection using region data to modify inspection thresholds Grant 7,639,863 - Isomura December 29, 2	2009-12-29
Ultrafine Pattern Discrimination Using Transmitted/reflected Workpiece Images For Use In Lithography Inspection System App 20090304262 - HARABE; Nobuyuki	2009-12-10
Die-to-die photomask defect detection using region data to modify inspection thresholds Grant 7,630,535 - Isomura December 8, 2	2009-12-08
Pattern inspection method and apparatus with high-accuracy pattern image correction capability Grant 7,627,164 - Oaki , et al. December 1, 2	2009-12-01
Pattern inspection method and apparatus using linear predictive model-based image correction technique Grant 7,627,165 - Oaki , et al. December 1, 2	2009-12-01
Mask Inspection Apparatus App 20090244530 - Iida; Susumu ; et al.	2009-10-01
Image Density-adapted Automatic Mode Switchable Pattern Correction Scheme For Workpiece Inspection App 20090245619 - Oaki; Junji ; et al.	2009-10-01
Ultrafine Lithography Pattern Inspection Using Multi-stage Tdi Image Sensors With False Image Removability App 20090238446 - Kataoka; Akira ; et al.	2009-09-24
Pattern Inspection Apparatus, Pattern Inspection Method, And Computer-readable Recording Medium Storing A Program App 20090238441 - YAMASHITA; Kyoji	2009-09-24
Light Polarization Control Using Serial Combination Of Surface-segmented Half Wavelength Plates App 20090237909 - OGAWA; Riki	2009-09-24
Pattern Image Correcting Apparatus, Pattern Inspection Apparatus, And Pattern Image Correcting Method App 20090214104 - SUGIHARA; Shinji	2009-08-27
Sample inspection apparatus, image alignment method, and program-recorded readable recording medium Grant 7,577,288 - Yamashita August 18, 2	2009-08-18
Image density-adapted automatic mode switchable pattern correction scheme for workpiece inspection Grant 7,565,032 - Oaki , et al. July 21, 2	2009-07-21
Image correction method Grant 7,539,350 - Oaki , et al. May 26, 2	2009-05-26
Method of operating laser light source Grant 7,539,222 - Matsuki May 26, 2	2009-05-26
Beam Irradiation Apparatus With Deep Ultraviolet Light Emission Device For Lithographic Pattern Inspection System App 20090084989 - IMAI; Shinichi	2009-04-02
Mask Blank For Euv Exposure And Mask For Euv Exposure App 20090075184 - HIRONO; Masatoshi	2009-03-19
Pattern inspection apparatus Grant 7,495,756 - Imai February 24, 2	2009-02-24
Level detection apparatus Grant 7,495,779 - Ogawa February 24, 2	2009-02-24
Pattern inspection system using image correction scheme with object-sensitive automatic mode switchability Grant 7,487,491 - Oaki , et al. February 3, 2	2009-02-03
Wavelength Converter System, Crystal Storage Apparatus, And Crystal Replacement Method Of Wavelength Converter App 20080291528 - SUSUMU; Iida	2008-11-27
Reticle Defect Inspection Apparatus And Reticle Defect Inspection Method App 20080259323 - Hirano; Ryoichi ; et al.	2008-10-23
Reticle Defect Inspection Apparatus And Inspection Method Using Thereof App 20080259328 - HIRANO; Ryoichi ; et al.	2008-10-23
Lighting Optical Apparatus And Sample Inspection Apparatus App 20080237489 - HIRONO; Masatoshi	2008-10-02
Reticle Defect Inspection Apparatus And Reticle Defect Inspection Method App 20080239290 - WATANABE; Toshiyuki ; et al.	2008-10-02
Level Detection Apparatus App 20080231846 - OGAWA; Riki	2008-09-25
Mask Pattern Inspection Apparatus With Koehler Illumination System Using Light Source Of High Spatial Coherency App 20080204737 - OGAWA; Riki ; et al.	2008-08-28
Light amount measurement device and light amount measurement method Grant 7,388,660 - Kobayashi , et al. June 17, 2	2008-06-17
Image Correction Method And Apparatus For Use In Pattern Inspection System App 20080050008 - Oaki; Junji	2008-02-28
Pattern Inspection Apparatus And Method With Enhanced Test Image Correctability Using Frequency Division Scheme App 20080050007 - Oaki; Junji	2008-02-28
Pattern Inspection Apparatus, Image Alignment Method, Displacement Amount Estimation Method, And Computer-readable Recording Medium With Program Recorded Thereon App 20080037860 - YAMASHITA; Kyoji	2008-02-14
Target Workpiece Inspection Apparatus, Image Alignment Method, And Computer-readable Recording Medium With Program Recorded Thereon App 20080036899 - YAMASHITA; Kyoji	2008-02-14
Pattern Inspection Apparatus App 20080013072 - IMAI; Shinichi	2008-01-17
Pattern Inspection Apparatus And Method With Local Critical Dimension Error Detectability App 20070292014 - NAKATANI; Yuichi	2007-12-20
Workpiece inspection apparatus assisting device, workpiece inspection method and computer-readable recording media storing program therefor Grant 7,275,006 - Tsuji , et al. September 25, 2	2007-09-25
Pattern inspection apparatus and method and workpiece tested thereby App 20070165938 - Matsumura; Kenichi ; et al.	2007-07-19
Pattern inspection apparatus and method along with workpiece tested thereby and management method of workpiece under testing App 20070146707 - Matsumura; Kenichi	2007-06-28
Light amount measurement device and light amount measurement method App 20070081149 - Kobayashi; Noboru ; et al.	2007-04-12
Pattern Inspection Apparatus, Pattern Inspection Method And Program App 20070071307 - ISOMURA; Ikunao	2007-03-29
Method Of Operating Laser Light Source App 20070071042 - Matsuki; Kazuto	2007-03-29
Pattern inspection apparatus, pattern inspection method, and inspection sample App 20070064998 - Umeda; Takuo ; et al.	2007-03-22
Pattern inspection apparatus App 20070064223 - Imai; Shinichi	2007-03-22
Workpiece inspection apparatus assisting device, workpiece inspection method and computer-readable recording media storing program therefor App 20070055467 - Tsuji; Yoshitake ; et al.	2007-03-08
Image correcting apparatus, pattern inspection apparatus, and image correcting method, and reticle App 20070053583 - Harabe; Nobuyuki	2007-03-08
Reference image forming apparatus, pattern inspection apparatus, and reference image forming method, and reticle App 20070052960 - Harabe; Nobuyuki	2007-03-08
Pattern inspection apparatus and method and reticle for use therein App 20070053578 - Harabe; Nobuyuki	2007-03-08
Sample inspection apparatus, image alignment method, and program-recorded readable recording medium App 20070053582 - Yamashita; Kyoji	2007-03-08
Pattern inspection apparatus, pattern inspection method, and program-recorded readable recording medium App 20070047798 - Isomura; Ikunao	2007-03-01
Pattern inspection apparatus, pattern inspection method, and program-recorded readable recording medium App 20070047799 - Isomura; Ikunao	2007-03-01
Pattern defect inspection method and apparatus using image correction technique App 20060222233 - Sugihara; Shinji ; et al.	2006-10-05
Image correcting method App 20060215899 - Oaki; Junji	2006-09-28

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