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Patent applications and USPTO patent grants for ADIGA; Umesh.The latest application filed is for "metrology of semiconductor devices in electron micrographs using fast marching level sets".
Patent | Date |
---|---|
Metrology Of Semiconductor Devices In Electron Micrographs Using Fast Marching Level Sets App 20210263430 - ADIGA; Umesh | 2021-08-26 |
Smart Metrology On Microscope Images App 20200349713 - Adiga; Umesh | 2020-11-05 |
Smart metrology on microscope images Grant 10,748,290 - Adiga A | 2020-08-18 |
Smart Metrology On Microscope Images App 20200134824 - ADIGA; Umesh | 2020-04-30 |
Systems and methods for processing low contrast images Grant 9,147,104 - Adiga , et al. September 29, 2 | 2015-09-29 |
Systems And Methods For Processing Low Contrast Images App 20140126802 - Adiga; Umesh ;   et al. | 2014-05-08 |
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