loadpatents
name:-0.025909900665283
name:-0.022765874862671
name:-0.10878396034241
Adel; Mike Patent Filings

Adel; Mike

Patent Applications and Registrations

Patent applications and USPTO patent grants for Adel; Mike.The latest application filed is for "periodic patterns and technique to control misalignment between two layers".

Company Profile
1.16.20
  • Adel; Mike - Zichron Ya'akov IL
  • Adel, Mike - Zichron Ya akev IL
  • Adel; Mike - Zichron Yaakov IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
Grant 10,649,447 - Izikson , et al.
2020-05-12
Periodic patterns and technique to control misalignment between two layers
Grant 10,151,584 - Abdulhalim , et al. Dec
2018-12-11
Periodic Patterns And Technique To Control Misalignment Between Two Layers
App 20180100735 - Abdulhalim; Ibrahim ;   et al.
2018-04-12
Periodic patterns and technique to control misalignment between two layers
Grant 9,835,447 - Abdulhalim , et al. December 5, 2
2017-12-05
Methods and Systems for Creating or Performing a Dynamic Sampling Scheme for a Process During Which Measurements Are Performed on Wafers
App 20170255188 - Izikson; Pavel ;   et al.
2017-09-07
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
Grant 9,651,943 - Izikson , et al. May 16, 2
2017-05-16
Periodic Patterns And Technique To Control Misalignment Between Two Layers
App 20170038198 - Abdulhalim; Ibrahim ;   et al.
2017-02-09
Periodic patterns and technique to control misalignment between two layers
Grant 9,476,698 - Abdulhalim , et al. October 25, 2
2016-10-25
Periodic Patterns and Technique to Control Misalignment Between Two Layers
App 20160084639 - Abdulhalim; Ibrahim ;   et al.
2016-03-24
Periodic patterns and techniques to control misalignment between two layers
Grant 9,234,745 - Abdulhalim , et al. January 12, 2
2016-01-12
Periodic Patterns and Techniques to Control Misalignment Between Two Layers
App 20150300815 - Abdulhalim; Ibrahim ;   et al.
2015-10-22
Periodic patterns and technique to control misalignment between two layers
Grant 9,103,662 - Abdulhalim , et al. August 11, 2
2015-08-11
Periodic Patterns and Technique to Control Misalignment Between Two Layers
App 20140022563 - Abdulhalim; Ibrahim ;   et al.
2014-01-23
Periodic patterns and technique to control misalignment between two layers
Grant 8,570,515 - Abdulhalim , et al. October 29, 2
2013-10-29
Periodic patterns and technique to control misaligment between two layers
Grant 8,525,994 - Abdulhalim , et al. September 3, 2
2013-09-03
Methods and Systems for Creating or Performing a Dynamic Sampling Scheme for a Process During Which Measurements Are Performed on Wafers
App 20120208301 - Izikson; Pavel ;   et al.
2012-08-16
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
Grant 8,175,831 - Izikson , et al. May 8, 2
2012-05-08
Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout
Grant 7,925,486 - Smith , et al. April 12, 2
2011-04-12
Periodic Patterns And Technique To Control Misalignment Between Two Layers
App 20100073688 - Abdulhalim; Ibrahim ;   et al.
2010-03-25
Periodic patterns and technique to control misalignment between two layers
Grant 7,656,528 - Abdulhalim , et al. February 2, 2
2010-02-02
Periodic Patterns And Technique To Control Misaligment Between Two Layers
App 20090231584 - Abdulhalim; Ibrahim ;   et al.
2009-09-17
Methods And Systems For Creating Or Performing A Dynamic Sampling Scheme For A Process During Which Measurements Are Performed On Wafers
App 20080286885 - Izikson; Pavel ;   et al.
2008-11-20
Computer-implemented Methods, Carrier Media, And Systems For Creating A Metrology Target Structure Design For A Reticle Layout
App 20070276634 - Smith; Mark ;   et al.
2007-11-29
Periodic Patterns and Technique to Control Misalignment Between Two Layers
App 20070127025 - Abdulhalim; Ibrahim ;   et al.
2007-06-07
Periodic patterns and technique to control misalignment between two layers
App 20060262326 - Abdulhalim; Ibrahim ;   et al.
2006-11-23
Periodic patterns and technique to control misalignment between two layers
App 20060132807 - Abdulhalim; Ibrahim ;   et al.
2006-06-22
Periodic patterns and technique to control misalignment between two layers
App 20060065625 - Abdulhalim; Ibrahim ;   et al.
2006-03-30
Periodic patterns and technique to control misalignment
App 20050208685 - Abdulhalim, Ibrahim ;   et al.
2005-09-22
Periodic patterns and technique to control misalignment between two layers
App 20050157297 - Abdulhalim, Ibrahim ;   et al.
2005-07-21
Periodic patterns and technique to control misalignment between two layers
App 20040229471 - Abdulhalim, Ibrahim ;   et al.
2004-11-18
Periodic patterns and technique to control misalignment between two layers
App 20040061857 - Abdulhalim, Ibrahim ;   et al.
2004-04-01
Periodic patterns and technique to control misalignment
App 20030002043 - Abdulhalim, Ibrahim ;   et al.
2003-01-02
Spectral bio-imaging of the eye
Grant 6,276,798 - Gil , et al. August 21, 2
2001-08-21

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