| Patent | Date |
|---|
Nano deposition and ablation for the repair and fabrication of integrated circuits
Grant 10,607,899 - Adderly , et al. | 2020-03-31 |
Centering substrates on a chuck
Grant 10,224,225 - Adderly , et al. | 2019-03-05 |
Waveguide structures used in phonotics chip packaging
Grant 10,078,183 - Adderly , et al. September 18, 2 | 2018-09-18 |
Centering Substrates On A Chuck
App 20180240694 - Adderly; Shawn A. ; et al. | 2018-08-23 |
Centering substrates on a chuck
Grant 9,997,385 - Adderly , et al. June 12, 2 | 2018-06-12 |
Centering Substrates On A Chuck
App 20170221742 - Adderly; Shawn A. ; et al. | 2017-08-03 |
Apparatus and method for centering substrates on a chuck
Grant 9,685,362 - Adderly , et al. June 20, 2 | 2017-06-20 |
Waveguide Structures
App 20170168242 - Adderly; Shawn A. ; et al. | 2017-06-15 |
Nano Deposition And Ablation For The Repair And Fabrication Of Integrated Circuits
App 20170117195 - Adderly; Shawn A. ; et al. | 2017-04-27 |
Nano deposition and ablation for the repair and fabrication of integrated circuits
Grant 9,583,401 - Adderly , et al. February 28, 2 | 2017-02-28 |
Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness
Grant 9,576,863 - Adderly , et al. February 21, 2 | 2017-02-21 |
Void monitoring device for measurement of wafer temperature variations
Grant 9,543,219 - Adderly , et al. January 10, 2 | 2017-01-10 |
Method and apparatus for detecting foreign material on a chuck
Grant 9,508,578 - Adderly , et al. November 29, 2 | 2016-11-29 |
Method Of Fine-tuning Process Controls During Integrated Circuit Chip Manufacturing Based On Substrate Backside Roughness
App 20160181166 - Adderly; Shawn A. ; et al. | 2016-06-23 |
Void Monitoring Device For Measurement Of Wafer Temperature Variations
App 20160155675 - Adderly; Shawn A. ; et al. | 2016-06-02 |
Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness
Grant 9,330,988 - Adderly , et al. May 3, 2 | 2016-05-03 |
Uniform roughness on backside of a wafer
Grant 9,275,868 - Adderly , et al. March 1, 2 | 2016-03-01 |
Anticipatorily loading a page of memory
Grant 9,201,806 - Adderly , et al. December 1, 2 | 2015-12-01 |
Achieving uniform capacitance between an electrostatic chuck and a semiconductor wafer
Grant 9,196,519 - Adderly , et al. November 24, 2 | 2015-11-24 |
Apparatus and Method for Centering Substrates on a Chuck
App 20150235881 - Adderly; Shawn A. ; et al. | 2015-08-20 |
Nano Deposition And Ablation For The Repair And Fabrication Of Integrated Circuits
App 20150228548 - Adderly; Shawn A. ; et al. | 2015-08-13 |
Method And Apparatus For Detecting Foreign Material On A Chuck
App 20150219479 - Adderly; Shawn A. ; et al. | 2015-08-06 |
Semiconductor structures with metal lines
Grant 9,087,839 - Adderly , et al. July 21, 2 | 2015-07-21 |
Achieving Uniform Capacitance Between An Electrostatic Chuck And A Semiconductor Wafer
App 20150138686 - Adderly; Shawn A. ; et al. | 2015-05-21 |
Method for reducing lateral extrusion formed in semiconductor structures and semiconductor structures formed thereof
Grant 9,006,703 - Adderly , et al. April 14, 2 | 2015-04-14 |
Method For Reducing Lateral Extrusion Formed In Semiconductor Structures And Semiconductor Structures Formed Thereof
App 20150035117 - Adderly; Shawn A. ; et al. | 2015-02-05 |
Uniform Roughness On Backside Of A Wafer
App 20150021743 - ADDERLY; Shawn A. ; et al. | 2015-01-22 |
Semiconductor Structures With Metal Lines
App 20140291802 - Adderly; Shawn A. ; et al. | 2014-10-02 |
Anticipatorily Loading A Page Of Memory
App 20140195771 - Adderly; Shawn A. ; et al. | 2014-07-10 |
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