Adams; R. Dean
Patent Applications and Registrations
Patent applications and USPTO patent grants for Adams; R. Dean.The latest application filed is for "redundant memory self-test".
- Adams; R. Dean - St. George VT
- Adams; R. Dean - Hanover NH
| Patent | Date |
|---|---|
| Testing of ECC memories Grant 7,308,621 - Adams , et al. December 11, 2 | 2007-12-11 |
| Asynchronous control of memory self test Grant 7,203,873 - Adams , et al. April 10, 2 | 2007-04-10 |
| Programable multi-port memory BIST with compact microcode Grant 7,168,005 - Adams , et al. January 23, 2 | 2007-01-23 |
| Optimized ECC/redundancy fault recovery Grant 7,149,941 - Adams , et al. December 12, 2 | 2006-12-12 |
| Method and apparatus for testing multi-port memories Grant 7,032,144 - Adams , et al. April 18, 2 | 2006-04-18 |
| Two-dimensional redundancy calculation Grant 7,003,704 - Adams , et al. February 21, 2 | 2006-02-21 |
| Built-in self test system and method for two-dimensional memory redundancy allocation Grant 6,907,554 - Adams , et al. June 14, 2 | 2005-06-14 |
| System initialization of microcode-based memory built-in self-test Grant 6,874,111 - Adams , et al. March 29, 2 | 2005-03-29 |
| Redundant memory self-test App 20050066226 - Adams, R. Dean ; et al. | 2005-03-24 |
| Built-in Self Test System And Method For Two-dimensional Memory Redundancy Allocation App 20040225939 - Adams, R. Dean ; et al. | 2004-11-11 |
| Two-dimensional redundancy calculation App 20040093540 - Adams, R. Dean ; et al. | 2004-05-13 |
| Method and apparatus for testing memory cells for data retention faults Grant 6,681,350 - Adams , et al. January 20, 2 | 2004-01-20 |
| Method and apparatus for testing multi-port memories App 20040006727 - Adams, R. Dean ; et al. | 2004-01-08 |
| Programmable memory built-in self-test combining microcode and finite state machine self-test Grant 6,651,201 - Adams , et al. November 18, 2 | 2003-11-18 |
| Testing of ECC memories App 20030204795 - Adams, R. Dean ; et al. | 2003-10-30 |
| Optimized ECC/redundancy fault recovery App 20030204798 - Adams, R. Dean ; et al. | 2003-10-30 |
| Programable multi-port memory bist with compact microcode App 20030120974 - Adams, R. Dean ; et al. | 2003-06-26 |
| Method and apparatus for testing memory cells for data retention faults App 20020166086 - Adams, R. Dean ; et al. | 2002-11-07 |
| Method and apparatus for testing memory App 20020116673 - Adams, R. Dean ; et al. | 2002-08-22 |
| Method and apparatus for testing memory App 20020114202 - Adams, R. Dean ; et al. | 2002-08-22 |
| On-chip test circuit for evaluating an on-chip signal using an external test signal Grant 6,163,862 - Adams , et al. December 19, 2 | 2000-12-19 |
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