adams bret w

Patent Applications and Registrations

Patent applications and USPTO patent grants for adams bret w.The latest application filed is for "polishing system with in-line and in-situ metrology".

Company Profile

2.13.9

- unknown
Adams; Bret W. - Sunnyvale CA US
Adams; Bret W. - Newburyport MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Dog carrier for use with a bicycle Grant D0866405 -	2019-11-12
Dog leash assembly for use with a bicycle Grant D0865303 -	2019-10-29
Computer-implemented process control in chemical mechanical polishing Grant 8,460,057 - Swedek , et al. June 11, 2	2013-06-11
Polishing System With In-line And In-situ Metrology App 20110195528 - Swedek; Boguslaw A. ; et al.	2011-08-11
Polishing system with in-line and in-situ metrology Grant 7,927,182 - Swedek , et al. April 19, 2	2011-04-19
Polishing System With In-line And In-situ Metrology App 20100062684 - Swedek; Boguslaw A. ; et al.	2010-03-11
Technique for matching performance of ion implantation devices using an in-situ mask Grant 7,619,229 - Nunan , et al. November 17, 2	2009-11-17
Computer-implemented method for process control in chemical mechanical polishing Grant 7,585,202 - Swedek , et al. September 8, 2	2009-09-08
Technique For Matching Performance Of Ion Implantation Devices Using An In-situ Mask App 20080087844 - Nunan; Peter D. ; et al.	2008-04-17
Polishing System With In-Line and In-Situ Metrology App 20080064300 - Swedek; Boguslaw A. ; et al.	2008-03-13
Polishing system with in-line and in-situ metrology Grant 7,294,039 - Swedek , et al. November 13, 2	2007-11-13
Polishing System With In-Line and In-Situ Metrology App 20060286904 - Swedek; Boguslaw A. ; et al.	2006-12-21
Methods and apparatus for adjusting ion implant parameters for improved process control App 20060240651 - Renau; Anthony ; et al.	2006-10-26
Polishing system with in-line and in-situ metrology Grant 7,101,251 - Swedek , et al. September 5, 2	2006-09-05
Polishing system with in-line and in-situ metrology App 20050245170 - Swedek, Boguslaw A. ; et al.	2005-11-03
Polishing system with in-line and in-situ metrology Grant 6,939,198 - Swedek , et al. September 6, 2	2005-09-06
Optical monitoring in a two-step chemical mechanical polishing process Grant 6,632,124 - Adams , et al. October 14, 2	2003-10-14
Optical Monitoring In A Two-step Chemical Mechanical Polishing Process App 20030104760 - Adams, Bret W. ; et al.	2003-06-05
Optical monitoring in a two-step chemical mechanical polishing process Grant 6,506,097 - Adams , et al. January 14, 2	2003-01-14
Optical Monitoring In A Two-step Chemical Mechanical Polishing Process App 20030003845 - Adams, Bret W. ; et al.	2003-01-02
Determining when to replace a retaining ring used in substrate polishing operations Grant 6,390,908 - Chen , et al. May 21, 2	2002-05-21
Integrated electrodeposition and chemical-mechanical polishing tool Grant 6,110,011 - Somekh , et al. August 29, 2	2000-08-29
Particle trap in a magnetron sputtering chamber Grant 6,013,159 - Adams , et al. January 11, 2	2000-01-11

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