Adam; Omer Abubaker Omer
Patent Applications and Registrations
Patent applications and USPTO patent grants for Adam; Omer Abubaker Omer.The latest application filed is for "metrology method, target and substrate".
- Adam; Omer Abubaker Omer - Eindhoven NL
- Adam; Omer Abubaker Omer - Veldhoven NL
| Patent | Date |
|---|---|
| Metrology method, target and substrate Grant 11,428,521 - Bhattacharyya , et al. August 30, 2 | 2022-08-30 |
| Measuring a process parameter for a manufacturing process involving lithography Grant 11,320,745 - Van Der Schaar , et al. May 3, 2 | 2022-05-03 |
| Metrology Method, Target And Substrate App 20220057192 - BHATTACHARYYA; Kaustuve ; et al. | 2022-02-24 |
| Metrology method, target and substrate Grant 11,204,239 - Bhattacharyya , et al. December 21, 2 | 2021-12-21 |
| Source separation from metrology data Grant 11,016,397 - Middlebrooks , et al. May 25, 2 | 2021-05-25 |
| Measuring a Process Parameter for a Manufacturing Process Involving Lithography App 20200401054 - Van Der Schaar; Maurits ; et al. | 2020-12-24 |
| Metrology Method, Target And Substrate App 20200348125 - BHATTACHARYYA; Kaustuve ; et al. | 2020-11-05 |
| Metrology method, target and substrate Grant 10,718,604 - Bhattacharyya , et al. | 2020-07-21 |
| Source Separation From Metrology Data App 20200192229 - MIDDLEBROOKS; Scott Anderson ; et al. | 2020-06-18 |
| Metrology method, target and substrate Grant 10,386,176 - Bhattacharyya , et al. A | 2019-08-20 |
| Measuring a Process Parameter for a Manufacturing Process Involving Lithography App 20190018326 - Van Der Schaar; Maurits ; et al. | 2019-01-17 |
| Measuring a process parameter for a manufacturing process involving lithography Grant 10,073,357 - Van Der Schaar , et al. September 11, 2 | 2018-09-11 |
| Method, apparatus and substrates for lithographic metrology Grant 10,042,268 - Smilde , et al. August 7, 2 | 2018-08-07 |
| Method and apparatus for design of a metrology target Grant 9,804,504 - Chen , et al. October 31, 2 | 2017-10-31 |
| Metrology method and apparatus, lithographic system and device manufacturing method Grant 9,719,945 - Smilde , et al. August 1, 2 | 2017-08-01 |
| Measuring a Process Parameter for a Manufacturing Process Involving Lithography App 20160349627 - VAN DER SCHAAR; Maurits ; et al. | 2016-12-01 |
| Method, Apparatus and Substrates for Lithographic Metrology App 20160291481 - SMILDE; Hendrik Jan Hidde ; et al. | 2016-10-06 |
| Method And Apparatus For Design Of A Metrology Target App 20160252820 - CHEN; Guangqing ; et al. | 2016-09-01 |
| Method and apparatus for design of a metrology target Grant 9,355,200 - Chen , et al. May 31, 2 | 2016-05-31 |
| Metrology Method, Target And Substrate App 20160061589 - BHATTACHARYYA; Kaustuve ; et al. | 2016-03-03 |
| Metrology Method and Apparatus, Lithographic System and Device Manufacturing Method App 20150346116 - SMILDE; Hendrik Jan Hidde ; et al. | 2015-12-03 |
| Metrology method and apparatus, lithographic system and device manufacturing method Grant 9,134,256 - Smilde , et al. September 15, 2 | 2015-09-15 |
| Method And Apparatus For Design Of A Metrology Target App 20150186581 - Chen; Guangqing ; et al. | 2015-07-02 |
| Metrology Method and Apparatus, Lithographic System and Device Manufacturing Method App 20130258310 - SMILDE; Hendrik Jan Hidde ; et al. | 2013-10-03 |
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