Adam; Ido

Patent Applications and Registrations

Patent applications and USPTO patent grants for Adam; Ido.The latest application filed is for "accuracy improvements in optical metrology".

Company Profile

3.3.5

Adam; Ido - Qiriat Ono IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Overlay measurement using multiple wavelengths Grant 11,158,548 - Lamhot , et al. October 26, 2	2021-10-26
Mitigation of inaccuracies related to grating asymmetries in scatterometry measurements Grant 11,112,704 - Adam , et al. September 7, 2	2021-09-07
Accuracy Improvements In Optical Metrology App 20210175132 - Bringoltz; Barak ; et al.	2021-06-10
Overlay Measurement Using Multiple Wavelengths App 20200381312 - Lamhot; Yuval ; et al.	2020-12-03
Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology Grant 10,831,108 - Marciano , et al. November 10, 2	2020-11-10
Mitigation of Inaccuracies Related to Grating Asymmetries in Scatterometry Measurements App 20190033726 - Adam; Ido ; et al.	2019-01-31
Accuracy Improvements In Optical Metrology App 20180047646 - Bringoltz; Barak ; et al.	2018-02-15
Methods Of Analyzing And Utilizing Landscapes To Reduce Or Eliminate Inaccuracy In Overlay Optical Metrology App 20160313658 - Marciano; Tal ; et al.	2016-10-27

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