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Magnetic recording medium including aniline material, method for manufacturing same, and laminate for heat transfer Grant 11,127,429 - Fukasawa , et al. September 21, 2 | 2021-09-21 |
Magnetic Recording Medium, Method For Manufacturing Same, And Laminate For Heat Transfer App 20200185000 - Fukasawa; Akira ;   et al. | 2020-06-11 |
Piston temperature state monitoring system for internal combustion engine and piston temperature monitoring method for internal combustion engine Grant 10,648,410 - Hanamura , et al. | 2020-05-12 |
Piston Temperature State Monitoring System For Internal Combustion Engine And Piston Temperature Monitoring Method For Internal App 20200025116 - HANAMURA; Yoshifumi ;   et al. | 2020-01-23 |
Test apparatus and test module Grant 9,342,425 - Yaguchi , et al. May 17, 2 | 2016-05-17 |
Test Apparatus And Test Module App 20130231886 - YAGUCHI; Takeshi ;   et al. | 2013-09-05 |
Method and structure to develop a test program for semiconductor integrated circuits Grant 8,255,198 - Krishnaswamy , et al. August 28, 2 | 2012-08-28 |
Compact representation of vendor hardware module revisions in an open architecture test system Grant 8,214,800 - Pramanick , et al. July 3, 2 | 2012-07-03 |
Method and system for performing installation and configuration management of tester instrument modules Grant 8,082,541 - Pramanick , et al. December 20, 2 | 2011-12-20 |
Test apparatus Grant 8,078,424 - Adachi December 13, 2 | 2011-12-13 |
Test equipment, method for loading test plan and program product Grant 7,809,520 - Adachi October 5, 2 | 2010-10-05 |
Method and Structure to Develop a Test Program for Semiconductor Integrated Circuits App 20100192135 - KRISHNASWAMY; Ramachandran ;   et al. | 2010-07-29 |
Test Apparatus App 20100082284 - Adachi; Toshiaki | 2010-04-01 |
Method and system for scheduling tests in a parallel test system Grant 7,543,200 - Pramanick , et al. June 2, 2 | 2009-06-02 |
Test Equipment, Method For Loading Test Plan And Program Product App 20090119054 - Adachi; Toshiaki | 2009-05-07 |
Test Emulator, Test Module Emulator And Record Medium Storing Program Therein App 20080016396 - Higashi; Shinsaku ;   et al. | 2008-01-17 |
Test Emulator, Test Module Emulator And Record Medium Storing Program Therein App 20080010524 - Higashi; Shinsaku ;   et al. | 2008-01-10 |
Method and structure to develop a test program for semiconductor integrated circuits Grant 7,209,851 - Singh , et al. April 24, 2 | 2007-04-24 |
Method and system for simulating a modular test system Grant 7,210,087 - Mukai , et al. April 24, 2 | 2007-04-24 |
Method and structure to develop a test program for semiconductor integrated circuits Grant 7,197,417 - Pramanick , et al. March 27, 2 | 2007-03-27 |
Supporting calibration and diagnostics in an open architecture test system Grant 7,197,416 - Adachi , et al. March 27, 2 | 2007-03-27 |
Method and system for controlling interchangeable components in a modular test system Grant 7,184,917 - Pramanick , et al. February 27, 2 | 2007-02-27 |
Compact representation of vendor hardware module revisions in an open architecture test system App 20060200816 - Pramanick; Ankan ;   et al. | 2006-09-07 |
Method and system for scheduling tests in a parallel test system App 20060195747 - Pramanick; Ankan ;   et al. | 2006-08-31 |
Method and system for performing installation and configuration management of tester instrument modules App 20060130041 - Pramanick; Ankan ;   et al. | 2006-06-15 |
Supporting calibration and diagnostics in an open architecture test system App 20050261855 - Adachi, Toshiaki ;   et al. | 2005-11-24 |
Method and system for simulating a modular test system App 20050262412 - Mukai, Conrad ;   et al. | 2005-11-24 |
Method and structure to develop a test program for semiconductor integrated circuits App 20050154550 - Singh, Harsanjeet ;   et al. | 2005-07-14 |
Method and structure to develop a test program for semiconductor integrated circuits App 20050154551 - Pramanick, Ankan ;   et al. | 2005-07-14 |
Test emulator, test module emulator, and record medium storing program therein App 20050039079 - Higashi, Shinsaku ;   et al. | 2005-02-17 |
Method and system for controlling interchangeable components in a modular test system App 20050022087 - Pramanick, Ankan ;   et al. | 2005-01-27 |
Method and structure to develop a test program for semiconductor integrated circuits App 20040225459 - Krishnaswamy, Ramachandran ;   et al. | 2004-11-11 |
Turbo charging system of diesel engine Grant 6,311,493 - Kurihara , et al. November 6, 2 | 2001-11-06 |