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Universal process kit Grant 11,049,760 - Joubert , et al. June 29, 2 | 2021-06-29 |
Minimization Of Ring Erosion During Plasma Processes App 20190043697 - JOUBERT; Olivier ;   et al. | 2019-02-07 |
Minimization of ring erosion during plasma processes Grant 10,109,464 - Joubert , et al. October 23, 2 | 2018-10-23 |
Ion Beam Sputtering With Ion Assisted Deposition For Coatings On Chamber Components App 20180105922 - Sun; Jennifer Y. ;   et al. | 2018-04-19 |
Ion Beam Sputtering With Ion Assisted Deposition For Coatings On Chamber Components App 20180010235 - Sun; Jennifer Y. ;   et al. | 2018-01-11 |
Ion Beam Sputtering With Ion Assisted Deposition For Coatings On Chamber Components App 20180010234 - Sun; Jennifer Y. ;   et al. | 2018-01-11 |
Ion beam sputtering with ion assisted deposition for coatings on chamber components Grant 9,797,037 - Sun , et al. October 24, 2 | 2017-10-24 |
Composite edge ring Grant D797,691 - Joubert , et al. September 19, 2 | 2017-09-19 |
Universal Process Kit App 20170256435 - JOUBERT; Olivier ;   et al. | 2017-09-07 |
Ion beam sputtering with ion assisted deposition for coatings on chamber components Grant 9,725,799 - Sun , et al. August 8, 2 | 2017-08-08 |
Minimization Of Ring Erosion During Plasma Processes App 20170200588 - JOUBERT; Olivier ;   et al. | 2017-07-13 |
Ion Beam Sputtering With Ion Assisted Deposition For Coatings On Chamber Components App 20160326625 - Sun; Jennifer Y. ;   et al. | 2016-11-10 |
Ion Beam Sputtering With Ion Assisted Deposition For Coatings On Chamber Components App 20150158775 - Sun; Jennifer Y. ;   et al. | 2015-06-11 |
Fast axis beam profile shaping for high power laser diode based annealing system Grant 8,288,683 - Jennings , et al. October 16, 2 | 2012-10-16 |
Real time process monitoring and control for semiconductor junctions Grant 8,110,828 - Achutharaman , et al. February 7, 2 | 2012-02-07 |
Real Time Process Monitoring And Control For Semiconductor Junctions App 20110259391 - Achutharaman; Vedapuram S. ;   et al. | 2011-10-27 |
Real time process monitoring and control for semiconductor junctions Grant 7,964,418 - Achutharaman , et al. June 21, 2 | 2011-06-21 |
Fast axis beam profile shaping by collimation lenslets for high power laser diode based annealing system Grant 7,674,999 - Jennings , et al. March 9, 2 | 2010-03-09 |
Fast axis beam profile shaping for high power laser diode based annealing system App 20090152247 - Jennings; Dean ;   et al. | 2009-06-18 |
Fast axis beam profile shaping by collimation lenslets for high power laser diode based annealing system App 20080210671 - Jennings; Dean ;   et al. | 2008-09-04 |
Controlled Annealing Method App 20080090309 - RANISH; JOSEPH MICHAEL ;   et al. | 2008-04-17 |
Real time process monitoring and control for semiconductor junctions App 20080041439 - Achutharaman; Vedapuram S. ;   et al. | 2008-02-21 |
Method and apparatus for planarization of a material by growing a sacrificial film with customized thickness profile Grant 6,916,744 - Achutharaman , et al. July 12, 2 | 2005-07-12 |
Thermally matched support ring for substrate processing chamber Grant 6,888,104 - Ranish , et al. May 3, 2 | 2005-05-03 |
Method and apparatus for planarization of a material by growing a sacrificial film with customized thickness profile App 20040121598 - Achutharaman, Vedapuram S. ;   et al. | 2004-06-24 |
Method And Apparatus For Improving Film Deposition Uniformity On A Substrate App 20020020358 - HEY, H. PETER W. ;   et al. | 2002-02-21 |
Method and apparatus for improving film deposition uniformity on a substrate Grant 6,022,587 - Hey , et al. February 8, 2 | 2000-02-08 |
Method and apparatus for forming an epitaxial titanium silicide film by low pressure chemical vapor deposition Grant 6,019,839 - Achutharaman , et al. February 1, 2 | 2000-02-01 |
Method of forming doped silicon in high aspect ratio openings Grant 5,863,598 - Venkatesan , et al. January 26, 1 | 1999-01-26 |