name:-0.27437615394592
name:-0.015311002731323
name:-0.00058102607727051
Accent Optical Technologies, Inc. Patent Filings

Accent Optical Technologies, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Accent Optical Technologies, Inc..The latest application filed is for "line profile asymmetry measurement".

Company Profile
0.12.16
  • Accent Optical Technologies, Inc. - Bend OR
  • Accent Optical Technologies, Inc. - Burbank CA
  • Accent Optical Technologies, Inc. - 131 NW Hawthorne, Suite 207 Bend OR
  • Accent Optical Technologies, Inc. -
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
Method for designing gratings
Grant 7,800,824 - Wang , et al. September 21, 2
2010-09-21
Method for measuring dimensions and optical system using the same
Grant 7,619,753 - Liu , et al. November 17, 2
2009-11-17
Method for correlating a structural parameter of a plurality of gratings and method for determining a structural parameter value of an unknown grating using the same
Grant 7,433,060 - Liu , et al. October 7, 2
2008-10-07
Method for inspecting a grating biochip
Grant 7,355,713 - Shyu , et al. April 8, 2
2008-04-08
Line Profile Asymmetry Measurement
App 20070201043 - Raymond; Christopher
2007-08-30
Apparatuses and methods for analyzing semiconductor workpieces
App 20070176119 - Hummel; Steve
2007-08-02
Apparatus and method for non-contact assessment of a constituent in semiconductor substrates
App 20070048948 - Vagos; Pedro
2007-03-01
Apparatuses and methods for detecting defects in semiconductor workpieces
App 20070000434 - Buczkowski; Andrzej
2007-01-04
Apparatus and method for enhanced critical dimension scatterometry
App 20060289789 - Raymond; Chris ;   et al.
2006-12-28
Apparatus and method for enhanced critical dimension scatterometry
App 20060289790 - Raymond; Chris ;   et al.
2006-12-28
Apparatus and method for enhanced critical dimension scatterometry
App 20060289788 - Raymond; Chris ;   et al.
2006-12-28
Apparatuses and methods for enhanced critical dimension scatterometry
App 20060285111 - Raymond; Chris ;   et al.
2006-12-21
Apparatus and method for enhanced critical dimension scatterometry
App 20060285110 - Raymond; Chris ;   et al.
2006-12-21
Apparatus and method for enhanced critical dimension scatterometry
App 20060278834 - Raymond; Chris ;   et al.
2006-12-14
Apparatus and method for enhanced critical dimension scatterometry
App 20060273263 - Raymond; Chris ;   et al.
2006-12-07
Apparatus and method for enhanced critical dimension scatterometry
App 20060243912 - Raymond; Chris ;   et al.
2006-11-02
Determination of center of focus by parameter variability analysis
Grant 7,119,893 - Littau , et al. October 10, 2
2006-10-10
Determination of center of focus by cross-section analysis
Grant 7,110,099 - Littau , et al. September 19, 2
2006-09-19
Method and device for determining a characteristic of a semicondctor sample
App 20060192573 - Srocka; Bernd
2006-08-31
Overlay measurement target
App 20060151890 - Smith; Nigel Peter ;   et al.
2006-07-13
Differential numerical aperture methods
Grant 7,053,991 - Sandusky May 30, 2
2006-05-30
Line profile asymmetry measurement using scatterometry
Grant 6,856,408 - Raymond February 15, 2
2005-02-15
Differential numerical aperture methods
App 20040246481 - Sandusky, John V.
2004-12-09
Determination of center of focus by parameter variability analysis
App 20040233445 - Littau, Michael E. ;   et al.
2004-11-25
Differential numerical aperture methods and device
Grant 6,750,968 - Sandusky June 15, 2
2004-06-15
Structure identification using scattering signatures
Grant 6,728,663 - Krukar , et al. April 27, 2
2004-04-27
Determination of center of focus by diffraction signature analysis
Grant 6,606,152 - Littau , et al. August 12, 2
2003-08-12
Determination of center of focus by diffraction signature analysis
Grant 6,429,930 - Littau , et al. August 6, 2
2002-08-06

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