Abel; Jeffery Bryan
Patent Applications and Registrations
Patent applications and USPTO patent grants for Abel; Jeffery Bryan.The latest application filed is for "x-ray inspection system that integrates manifest data with imaging/detection processing".
- Abel; Jeffery Bryan - Issaquah WA
| Patent | Date |
|---|---|
| X-ray inspection system that integrates manifest data with imaging/detection processing Grant 9,111,331 - Parikh , et al. August 18, 2 | 2015-08-18 |
| X-ray Inspection System That Integrates Manifest Data With Imaging/detection Processing App 20130101172 - Parikh; Shehul Sailesh ; et al. | 2013-04-25 |
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