loadpatents
name:-0.06914496421814
name:-0.041525840759277
name:-0.0088109970092773
Abe; Yoshihisa Patent Filings

Abe; Yoshihisa

Patent Applications and Registrations

Patent applications and USPTO patent grants for Abe; Yoshihisa.The latest application filed is for "nitride semiconductor substrate and method of manufacturing the same".

Company Profile
8.42.49
  • Abe; Yoshihisa - Sakai JP
  • Abe; Yoshihisa - Hadano JP
  • ABE; Yoshihisa - Hadano-shi JP
  • Abe; Yoshihisa - Kanagawa JP
  • Abe; Yoshihisa - Kanonji JP
  • ABE; Yoshihisa - Sakai-shi JP
  • Abe; Yoshihisa - Osaka JP
  • Abe; Yoshihisa - Kanonji-city JP
  • Abe; Yoshihisa - Osaka-shi JP
  • ABE; Yoshihisa - Hadano City JP
  • Abe; Yoshihisa - Kagawa JP
  • Abe; Yoshihisa - Yokohama JP
  • Abe; Yoshihisa - Sagamihara JP
  • Abe; Yoshihisa - Sagamihara-shi JP
  • Abe; Yoshihisa - Yokohama-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Colorimeter capable of taking a fixed posture with respect to a measurement object
Grant 11,280,677 - Aomatsu , et al. March 22, 2
2022-03-22
Nitride semiconductor substrate
Grant 11,201,217 - Eriguchi , et al. December 14, 2
2021-12-14
Optical measuring device, image generating method, and image generating program
Grant 11,089,225 - Yamamoto , et al. August 10, 2
2021-08-10
Nitride Semiconductor Substrate And Method Of Manufacturing The Same
App 20210184004 - OISHI; Hiroshi ;   et al.
2021-06-17
Nitride Semiconductor Substrate
App 20210028284 - ERIGUCHI; Kenichi ;   et al.
2021-01-28
Nitride semiconductor substrate
Grant 10,825,895 - Abe , et al. November 3, 2
2020-11-03
Nitride Semiconductor Substrate
App 20200194545 - ABE; Yoshihisa ;   et al.
2020-06-18
Nitride Semiconductor Substrate And Nitride Semiconductor Device
App 20200194580 - ABE; Yoshihisa ;   et al.
2020-06-18
Nitride semiconductor substrate and method for manufacturing the same
Grant 10,593,790 - Abe , et al.
2020-03-17
Nitride semiconductor epitaxial substrate
Grant 10,559,679 - Oishi , et al. Feb
2020-02-11
Susceptor and method for manufacturing same
Grant 10,522,386 - Shinohara , et al. Dec
2019-12-31
Optical Measuring Device, Image Generating Method, And Image Generating Program
App 20190158756 - YAMAMOTO; Koji ;   et al.
2019-05-23
Colorimeter
App 20190154508 - AOMATSU; Hiroki ;   et al.
2019-05-23
Nitride Semiconductor Epitaxial Substrate
App 20190074369 - OISHI; Hiroshi ;   et al.
2019-03-07
Compound semiconductor substrate
Grant 10,068,858 - Abe , et al. September 4, 2
2018-09-04
Nitride Semiconductor Substrate And Method For Manufacturing The Same
App 20180240903 - ABE; Yoshihisa ;   et al.
2018-08-23
Nitride Semiconductor Substrate
App 20180151714 - OMORI; Noriko ;   et al.
2018-05-31
Surface characteristic measurement device
Grant 9,976,905 - Takebe , et al. May 22, 2
2018-05-22
Surface inspection device, surface inspection method, and program
Grant 9,885,668 - Komatsu , et al. February 6, 2
2018-02-06
Surface Inspection Device, Surface Inspection Method, And Program
App 20170261439 - Komatsu; Takafumi ;   et al.
2017-09-14
Nitride semiconductor substrate having recesses at interface between base substrate and initial nitride
Grant 9,748,344 - Omori , et al. August 29, 2
2017-08-29
Surface Characteristic Measurement Device
App 20170199079 - Takebe; Yosuke ;   et al.
2017-07-13
Susceptor And Method For Manufacturing Same
App 20170162425 - Shinohara; Masato ;   et al.
2017-06-08
Compound Semiconductor Substrate
App 20170110414 - ABE; Yoshihisa ;   et al.
2017-04-20
Nitride Semiconductor Substrate
App 20170011919 - Omori; Noriko ;   et al.
2017-01-12
Nitride semiconductor substrate
Grant 9,536,955 - Komiyama , et al. January 3, 2
2017-01-03
Nitride semiconductor substrate
Grant 9,530,846 - Omori , et al. December 27, 2
2016-12-27
Nitride Semiconductor Substrate
App 20160293710 - Omori; Noriko ;   et al.
2016-10-06
Method for carburizing tantalum container
Grant 9,435,018 - Watanabe , et al. September 6, 2
2016-09-06
Spectroscopic Analysis System and Method
App 20160131526 - Harada; Koji ;   et al.
2016-05-12
Method for carburizing tantalum member, and tantalum member
Grant 8,986,466 - Abe , et al. March 24, 2
2015-03-24
Nitride Semiconductor Substrate
App 20140319535 - KOMIYAMA; Jun ;   et al.
2014-10-30
Nitride semiconductor substrate and method of manufacturing the same
Grant 8,785,942 - Yoshida , et al. July 22, 2
2014-07-22
Nitride semiconductor substrate
Grant 8,637,960 - Abe , et al. January 28, 2
2014-01-28
Method For Carburizing Tantalum Container
App 20130240090 - Watanabe; Masanari ;   et al.
2013-09-19
Image processing apparatus, information processing system, and image processing method
Grant 8,538,137 - Sumitomo , et al. September 17, 2
2013-09-17
Nitride Semiconductor Substrate
App 20130082355 - ABE; Yoshihisa ;   et al.
2013-04-04
Nitride Semiconductor Substrate And Method Of Manufacturing The Same
App 20120211763 - Yoshida; Akira ;   et al.
2012-08-23
Tantalum carbide-coated carbon material and production method thereof
Grant 8,216,667 - Fujiwara , et al. July 10, 2
2012-07-10
Compound semiconductor substrate comprising a multilayer buffer layer
Grant 8,212,288 - Komiyama , et al. July 3, 2
2012-07-03
Compound semiconductor substrate having multiple buffer layers
Grant 8,148,753 - Oishi , et al. April 3, 2
2012-04-03
Method For Carburizing Tantalum Member, And Tantalum Member
App 20120067462 - Abe; Yoshihisa ;   et al.
2012-03-22
Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor
Grant 8,121,814 - Abe , et al. February 21, 2
2012-02-21
Tantalum Carbide-Coated Carbon Material and Production Method Thereof
App 20120040172 - Fujiwara; Hirokazu ;   et al.
2012-02-16
Compound Semiconductor Substrate
App 20110062556 - KOMIYAMA; Jun ;   et al.
2011-03-17
Image Processing Apparatus, Information Processing System, And Image Processing Method
App 20110026773 - SUMITOMO; Hironori ;   et al.
2011-02-03
Three-dimensional shape measuring apparatus
Grant 7,812,969 - Morimoto , et al. October 12, 2
2010-10-12
Compound semiconductor substrate
App 20100244100 - Oishi; Hiroshi ;   et al.
2010-09-30
Method and system for three-dimensional measurement and method and device for controlling manipulator
Grant 7,764,386 - Horita , et al. July 27, 2
2010-07-27
Method and system for three-dimensional measurement
Grant 7,724,380 - Horita , et al. May 25, 2
2010-05-25
Three-dimensional shape measuring system
Grant 7,715,020 - Yamaguchi , et al. May 11, 2
2010-05-11
Method and system for aligning three-dimensional shape data from photogrammetry data and three-dimensional measurement data using target locations and surface vectors
Grant 7,684,613 - Harada , et al. March 23, 2
2010-03-23
Three-dimensional shape measuring system, and three-dimensional shape measuring method
Grant 7,643,159 - Yamamoto , et al. January 5, 2
2010-01-05
Composition for oil-based liquid cleansing
Grant 7,592,298 - Takeuchi , et al. September 22, 2
2009-09-22
Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor
App 20090201292 - Abe; Yoshihisa ;   et al.
2009-08-13
Compound Semiconductor Substrate
App 20090065812 - ABE; Yoshihisa ;   et al.
2009-03-12
Three-dimensional measuring system
Grant 7,495,776 - Kubo , et al. February 24, 2
2009-02-24
Three-dimensional shape measuring method, three-dimensional shape measuring apparatus, and focus adjusting method
Grant 7,436,525 - Mukai , et al. October 14, 2
2008-10-14
Nitride Semiconductor Single Crystal Substrate
App 20080224268 - Abe; Yoshihisa ;   et al.
2008-09-18
Compound semiconductor and compound semiconductor device using the same
Grant 7,368,757 - Komiyama , et al. May 6, 2
2008-05-06
Three-dimensional shape measuring system, and three-dimensional shape measuring method
App 20080024795 - Yamamoto; Shinji ;   et al.
2008-01-31
Three-dimensional shape measuring apparatus
App 20070296979 - Morimoto; Koji ;   et al.
2007-12-27
Three-dimensional shape measuring system
App 20070291281 - Yamaguchi; Wataru ;   et al.
2007-12-20
Three-dimensional shape measuring method, three-dimensional shape measuring apparatus, and focus adjusting method
App 20070285672 - Mukai; Takayuki ;   et al.
2007-12-13
Composition for Oil-Based Liquid Cleansing
App 20070232515 - Takeuchi; Nobuyuki ;   et al.
2007-10-04
Nitride semiconductor single crystal film
App 20070210304 - Komiyama; Jun ;   et al.
2007-09-13
Substrate for growing electro-optical single crystal thin film and method of manufacturing the same
Grant 7,262,485 - Abe , et al. August 28, 2
2007-08-28
Composition containing polyglycerol/medium-chain fatty acid ester
App 20070116663 - Iwanaga; Tetsuro ;   et al.
2007-05-24
Method and system for three-dimensional measurement and method and device for controlling manipulator
App 20070078624 - Horita; Shinichi ;   et al.
2007-04-05
Substrate for compound semiconductor device and compound semiconductor device using the same
App 20070069216 - Komiyama; Jun ;   et al.
2007-03-29
Three-dimensional measuring system
App 20060290945 - Kubo; Akira ;   et al.
2006-12-28
Method and apparatus for aligning three-dimensional shape data
App 20060269124 - Harada; Koji ;   et al.
2006-11-30
Method and system for three-dimensional measurement
App 20060269123 - Horita; Shinichi ;   et al.
2006-11-30
Compound semiconductor and compound semiconductor device using the same
App 20060138448 - Komiyama; Jun ;   et al.
2006-06-29
Substrate for growing electro-optical single crystal thin film and method of manufacturing the same
App 20060011941 - Abe; Yoshihisa ;   et al.
2006-01-19
Substrates for growth of chemical compound semiconductors, chemical compound semiconductors using the substrates and processes for producing thereof
App 20050263754 - Komiyama, Jun ;   et al.
2005-12-01
Method and apparatus for reducing three-dimensional shape data
Grant 6,958,753 - Abe October 25, 2
2005-10-25
Semiconductor wafer and its manufacturing method
Grant 6,936,490 - Abe , et al. August 30, 2
2005-08-30
Three-dimensional shape-measuring system
Grant 6,798,527 - Fukumoto , et al. September 28, 2
2004-09-28
Method and apparatus for extracting surface from three-dimensional shape data as well as recording medium
Grant 6,778,172 - Harada , et al. August 17, 2
2004-08-17
Semiconductor wafer and its manufacturing method
App 20040053438 - Abe, Yoshihisa ;   et al.
2004-03-18
Three-dimensional shape measuring apparatus
App 20030058455 - Ebihara, Akimitsu ;   et al.
2003-03-27
Three-dimensional shape-measuring system
App 20020171847 - Fukumoto, Tadashi ;   et al.
2002-11-21
Method and apparatus for extracting surface from three-dimensional shape data as well as recording medium
App 20020030676 - Harada, Koji ;   et al.
2002-03-14
Method and apparatus for reducing three-dimensional shape data
App 20020003539 - Abe, Yoshihisa
2002-01-10
Process for production of coal-water mixture
Grant 5,012,984 - Ishikawa , et al. May 7, 1
1991-05-07

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed