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Abdulrashid; Fariz bin Patent Filings

Abdulrashid; Fariz bin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Abdulrashid; Fariz bin.The latest application filed is for "optical surface defect inspection apparatus and optical surface defect inspection method".

Company Profile
0.1.2
  • Abdulrashid; Fariz bin - Kamisato-machi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method and apparatus for inspecting surface of a disk
Grant 8,873,031 - Yanaka , et al. October 28, 2
2014-10-28
Optical Surface Defect Inspection Apparatus And Optical Surface Defect Inspection Method
App 20130286386 - SERIKAWA; Shigeru ;   et al.
2013-10-31
Method And Apparatus For Inspecting Surface Of A Disk
App 20130258326 - HORIE; Kiyotaka ;   et al.
2013-10-03

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