Abdel-Hafez; Khader S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Abdel-Hafez; Khader S..The latest application filed is for "method and apparatus for broadcasting scan patterns in a scan-based integrated circuit".

Company Profile

0.12.12

Abdel-Hafez; Khader S. - Sunnyvale CA
Abdel-Hafez; Khader S. - San Francisco CA
Abdel-Hafez; Khader S. - San Franciso CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit Grant 9,696,377 - Wang , et al. July 4, 2	2017-07-04
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit Grant 7,721,173 - Wang , et al. May 18, 2	2010-05-18
Method And Apparatus For Broadcasting Scan Patterns In A Scan-based Integrated Circuit App 20090235132 - Wang; Laung-Terng ; et al.	2009-09-17
Method and apparatus for pipelined scan compression Grant 7,590,905 - Abdel-Hafez , et al. September 15, 2	2009-09-15
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit Grant 7,552,373 - Wang , et al. June 23, 2	2009-06-23
Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit Grant 7,512,851 - Wang , et al. March 31, 2	2009-03-31
Method and apparatus for unifying self-test with scan-test during prototype debug and production test App 20090037786 - Wang; Laung-Terng ; et al.	2009-02-05
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit App 20080276141 - Wang; Laung-Terng(L.-T.) ; et al.	2008-11-06
Method and apparatus for unifying self-test with scan-test during prototype debug and production test Grant 7,444,567 - Wang , et al. October 28, 2	2008-10-28
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit Grant 7,412,672 - Wang , et al. August 12, 2	2008-08-12
Method and apparatus for multi-level scan compression Grant 7,231,570 - Wang , et al. June 12, 2	2007-06-12
Method for performing ATPG and fault simulation in a scan-based integrated circuit Grant 7,210,082 - Abdel-Hafez , et al. April 24, 2	2007-04-24
Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits Grant 7,124,342 - Wang , et al. October 17, 2	2006-10-17
Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits Grant 7,058,869 - Abdel-Hafez , et al. June 6, 2	2006-06-06
Mask network design for scan-based integrated circuits Grant 7,032,148 - Wang , et al. April 18, 2	2006-04-18
Method and apparatus for pipelined scan compression App 20060064614 - Abdel-Hafez; Khader S. ; et al.	2006-03-23
Method and apparatus for multi-level scan compression App 20050268194 - Wang, Laung-Terng (L.T.) ; et al.	2005-12-01
Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits App 20050262409 - Wang, Laung-Terng ; et al.	2005-11-24
Mask network design for scan-based integrated circuits App 20050060625 - Wang, Laung-Terng ; et al.	2005-03-17
Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit App 20050055617 - Wang, Laung-Terng ; et al.	2005-03-10
Method and apparatus for unifying self-test with scan-test during prototype debug and production test App 20040268181 - Wang, Laung-Terng ; et al.	2004-12-30
Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits App 20040237015 - Abdel-Hafez, Khader S. ; et al.	2004-11-25
Method and apparatus for testing asynchronous set/reset faults in a scan-based integrated circuit App 20040153926 - Abdel-Hafez, Khader S. ; et al.	2004-08-05
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit App 20030154433 - Wang, Laung-Terng ; et al.	2003-08-14

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