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Patent applications and USPTO patent grants for Abdalla; Wafaa.The latest application filed is for "surface inspection by scattered light detection using dithered illumination spot".
Patent | Date |
---|---|
Surface inspection by amplitude modulated specular light detection Grant 7,623,427 - Jann , et al. November 24, 2 | 2009-11-24 |
Surface inspection by double pass laser doppler vibrometry Grant 7,554,670 - Jann , et al. June 30, 2 | 2009-06-30 |
Surface inspection by scattered light detection using dithered illumination spot App 20070247617 - Jann; Peter C. ;   et al. | 2007-10-25 |
Surface inspection by double pass laser doppler vibrometry App 20070165239 - Jann; Peter C. ;   et al. | 2007-07-19 |
Surface inspection by amplitude modulated specular light detection App 20070165504 - Jann; Peter C. ;   et al. | 2007-07-19 |
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