Abadeer; Wagdi William

Patent Applications and Registrations

Patent applications and USPTO patent grants for Abadeer; Wagdi William.The latest application filed is for "monitoring ionizing radiation in silicon-on insulator integrated circuits".

Company Profile

0.6.9

Abadeer; Wagdi William - Jericho VT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Digital-to-analog converter using dual-gate transistors Grant 7,545,297 - Abadeer , et al. June 9, 2	2009-06-09
Design structure for a digital-to-analog converter using dual-gate transistors Grant 7,545,298 - Abadeer , et al. June 9, 2	2009-06-09
Monitoring Ionizing Radiation In Silicon-on Insulator Integrated Circuits App 20090113357 - Abadeer; Wagdi William ; et al.	2009-04-30
Design Structure For A Digital-to-analog Converter Using Dual-gate Transistors App 20090058704 - Abadeer; Wagdi William ; et al.	2009-03-05
Digital-to-analog Converter Using Dual-gate Transistors App 20090058703 - Abadeer; Wagdi William ; et al.	2009-03-05
Device for monitoring ionizing radiation in silicon-on insulator integrated circuits Grant 7,473,904 - Abadeer , et al. January 6, 2	2009-01-06
Monitoring Ionizing Radiation In Silicon-on Insulator Integrated Circuits App 20080128629 - Abadeer; Wagdi William ; et al.	2008-06-05
Monitoring ionizing radiation in silicon-on insulator integrated circuits Grant 7,375,339 - Abadeer , et al. May 20, 2	2008-05-20
Monitoring Ionizing Radiation In Silicon-on Insulator Integrated Circuits App 20070252088 - Abadeer; Wagdi William ; et al.	2007-11-01
Method for fabricating high performance metal-insulator-metal capacitor (MIMCAP) App 20070173029 - Abadeer; Wagdi William ; et al.	2007-07-26
Resettable fuse device and method of fabricating the same Grant 7,227,239 - Abadeer , et al. June 5, 2	2007-06-05
Resettable fuse device and method of fabricating the same App 20060060938 - Abadeer; Wagdi William ; et al.	2006-03-23
Non-continuous Encapsulation Layer For Mim Capacitor App 20040251514 - Abadeer, Wagdi William ; et al.	2004-12-16
System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) Grant 6,731,179 - Abadeer , et al. May 4, 2	2004-05-04
System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) App 20030189465 - Abadeer, Wagdi William ; et al.	2003-10-09

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.