WAFERS LIKE ME

Mark For: WAFERS LIKE ME® trademark registration is intended to cover the categories of downloadable and prerecorded computer software for detecting and classifying wafer signatures and defects for semiconductor manufacturers to make process adjustments to maximize wafer and semiconductor yield; downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries. [all]

Status

2022-02-08 UTC
⟳ Refresh

LIVE APPLICATION Under Examination

Research	OneLook Acronym Finder
Serial Number	88901359
Registration Number	1574047
Mark Literal Elements	WAFERS LIKE ME
Mark Drawing Type	4 - STANDARD CHARACTER MARK
Mark Type	TRADEMARK
Register	PRINCIPAL
Current Location	INTENT TO USE SECTION 2020-09-08
Basis	1(b)
Class Status	ACTIVE
Primary US Classes	021: Electrical Apparatus, Machines and Supplies 023: Cutlery, Machinery, Tools and Parts Thereof 026: Measuring and Scientific Appliances 036: Musical Instruments and Supplies 038: Prints and Publications
Primary International Class	009 - Primary Class (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use	No
Current Use	No
Intent To Use	Yes
Filed ITU	Yes
44D Filed	No
44E Current	No
66A Current	No
Current Basis	No
No Basis	No
Attorney Name	Harold Milstein
Attorney Docket Number	19PP-310175

Timeline

IC 009. US 021 023 026 036 038. G & S: Downloadable and prerecorded computer software for detecting and classifying wafer signatures and defects for semiconductor manufacturers to make process adjustments to maximize wafer and semiconductor yield; downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries