Mark For: POLARIZATION MAPPER (PMAP)™ trademark registration is intended to cover the categories of
Research |
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Serial Number | 76666231 |
Mark Literal Elements | POLARIZATION MAPPER (PMAP) |
Mark Drawing Type | 4 - STANDARD CHARACTER MARK |
Mark Type | TRADEMARK |
Register | PRINCIPAL |
Current Location | TMEG LAW OFFICE 103 - EXAMINING ATTORNEY ASSIGNED 2007-02-08 |
Basis | 1(b) |
Class Status | ACTIVE |
Primary US Classes |
|
Primary International Class |
|
Filed Use | No |
Current Use | No |
Intent To Use | Yes |
Filed ITU | Yes |
44D Filed | No |
44E Current | No |
66A Current | No |
Current Basis | No |
No Basis | No |
Law Office Assigned | L30 |
Employee Name | GILBERT, REBECCA L |
2006-09-18 | Application Filed |
2007-02-08 | Location: TMEG LAW OFFICE 103 - EXAMINING ATTORNEY ASSIGNED |
2007-07-25 | Abandon |
2007-07-26 | Status: Abandoned because the applicant filed an express abandonment. To view all documents in this file, click on the Trademark Documen |
2007-07-26 | Status: Dead/Abandoned |
2018-07-08 | Transaction Date |
Party: | ![]() |
Address | 6142 Nancy Ridge Drive; Ste. 102 San Diego, CALIFORNIA UNITED STATES 92121 |
Legal Entity Type | Corporation |
Legal Entity State | CALIFORNIA |
![]() | 2006-09-18 | |
![]() | 2006-09-18 | |
![]() | 2006-09-29 | |
![]() | APPLICATION/XML | 2007-02-08 |
![]() | 2007-02-08 | |
![]() | APPLICATION/XML | 2007-02-08 |
![]() | 2007-07-05 | |
![]() | 2007-07-25 | |
![]() | 2007-07-26 |
(ABANDONED)
IC 009. US 021 023 026 036 038. G & S: Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and combined in-situ imaging objectives and multiple polarizing elements for use in exposing photographically prepared patterns and images that are used for measuring and adjusting projection imaging systems used in the manufacture of integrated circuits
International Codes: | 9 |
U.S. Codes: | 021,023,026,036,038 |
Type Code | Type |
---|---|
GS0091 | Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and combined in-situ imaging objectives and multiple polarizing elements for use in exposing photographically prepared patterns and images that are used for measuring and adjusting projection imaging systems used in the manufacture of integrated circuits |
Description | Date | Proceeding Number |
---|---|---|
ABANDONMENT NOTICE MAILED - EXPRESS ABANDONMENT | 2007-07-26 | |
ABANDONMENT - EXPRESS MAILED | 2007-07-26 | |
TEAS EXPRESS ABANDONMENT RECEIVED | 2007-07-25 | |
TEAS CHANGE OF CORRESPONDENCE RECEIVED | 2007-07-05 | |
NON-FINAL ACTION WRITTEN | 2007-02-08 | 74825 |
NON-FINAL ACTION E-MAILED | 2007-02-08 | 6325 |
ASSIGNED TO EXAMINER | 2007-02-08 | 74825 |
APPLICATION FILING RECEIPT MAILED | 2006-09-29 | |
NEW APPLICATION ENTERED IN TRAM | 2006-09-25 |
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