| PTO Form 1957 (Rev 8/2005) |
| OMB Control #0651-0050 (Exp. 04/30/2006) |
| Input Field |
Entered |
| SERIAL NUMBER | 76574016 |
| MARK SECTION (no change) | |
| GOODS AND/OR SERVICES SECTION (no change) | |
| ADDITIONAL STATEMENTS SECTION | |
| DISCLAIMER | No claim is made to the exclusive right to use Source Metrology Instrument apart from the mark as shown. |
| MISCELLANEOUS STATEMENT | RESPONSE TO IDENTIFICATION OF GOODS: The applicant wishes to adopt the following identification: Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and in-situ imaging objectives of the pinhole, refractive or reflective kind, in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits; in International Class 9. |
| SIGNATURE SECTION | |
| RESPONSE SIGNATURE | /Robert O. Hunter, Jr./ |
| SIGNATORY NAME | Robert O. Hunter, Jr. |
| SIGNATORY POSITION | President |
| SIGNATURE DATE | 02/03/2005 |
| FILING INFORMATION SECTION | |
| SUBMIT DATE | Thu Feb 03 14:49:44 EST 2005 |
| TEAS STAMP | USPTO/OA-XXXXXXXXXX-20050 203144944901175-76574016- 2008dc43ce210258bb337eef8 e8fb53ce9-N-N-20050203144 851349911 |
| PTO Form 1957 (Rev 8/2005) |
| OMB Control #0651-0050 (Exp. 04/30/2006) |
| Application serial no. 76574016 is amended as follows: | |
| Additional Statements | |
| No claim is made to the exclusive right to use Source Metrology Instrument apart from the mark as shown. | |
| RESPONSE TO IDENTIFICATION OF GOODS: The applicant wishes to adopt the following identification: Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and in-situ imaging objectives of the pinhole, refractive or reflective kind, in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits; in International Class 9. | |
| Response Signature | |
| Signature: /Robert O. Hunter, Jr./ Date: 02/03/2005 | |
| Signatory's Name: Robert O. Hunter, Jr. | |
| Signatory's Position: President | |
| Serial Number: 76574016 | |
| Internet Transmission Date: Thu Feb 03 14:49:44 EST 2005 | |
| TEAS Stamp: USPTO/OA-XXXXXXXXXX-20050203144944901175 -76574016-2008dc43ce210258bb337eef8e8fb5 3ce9-N-N-20050203144851349911 |