SOURCE METROLOGY INSTRUMENT (SMI)

Mark For: SOURCE METROLOGY INSTRUMENT (SMI)® trademark registration is intended to cover the categories of components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and in-situ imaging objectives of the pinhole, refractive or reflective kind, in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits. [all]

Status

2022-06-06 UTC
⟳ Refresh

DEAD REGISTRATION Cancelled Invalidated

Research	OneLook Acronym Finder
Serial Number	76574016
Registration Number	3101233
Mark Literal Elements	SOURCE METROLOGY INSTRUMENT (SMI)
Mark Drawing Type	4 - STANDARD CHARACTER MARK
Mark Type	TRADEMARK
Register	PRINCIPAL-2(F)
Current Location	PUBLICATION AND ISSUE SECTION 2006-04-24
Basis	1(a)
Class Status	SECTION 8 - CANCEL
Primary US Classes	021: Electrical Apparatus, Machines and Supplies 023: Cutlery, Machinery, Tools and Parts Thereof 026: Measuring and Scientific Appliances 036: Musical Instruments and Supplies 038: Prints and Publications
Primary International Class	009 - Primary Class (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use	No
Current Use	Yes
Intent To Use	No
Filed ITU	Yes
44D Filed	No
44E Current	No
66A Current	No
Current Basis	No
No Basis	No
Cancellation Code	2
Law Office Assigned	L20
Employee Name	CRAWFORD, MARY E

Timeline

(CANCELLED)
IC 009. US 021 023 026 036 038. G & S: Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and in-situ imaging objectives of the pinhole, refractive or reflective kind, in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits. FIRST USE: 19950101. FIRST USE IN COMMERCE: 19950101