Mark For: BUDGETSENSORS® trademark registration is intended to cover the categories of [ Scanning probe microscopes, scanning electronic microscopes and atomic force microscopes; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for non-optical microscopes and optical near field microscopes; [ electric and electronic and micro-mechanical and micro-electromechanical instruments and apparatus for detection of pressure, gases, temperature, intensity of light, forces, acceleration, vibrations, nick angle, humidity, distances, speed, roughness, thickness, acoustic waves, and molecules for measuring surface topography, height, electrical and magnetical surface properties,potentials and currents, and for applying electromagnetic irradiation, temperatures, mechanical, electrical and magnetical forces, currents and potentials to a substrate; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for atomic force microscopy, for scanning probe microscopy, and for scanning electronic microscopy; electric and electronic and micro-mechanical and micro-electromechanical sensors comprised of micro-mechanical cantilevers and membranes. [all]
Status
2022-08-01 UTC
LIVE REGISTRATION Issued and Active
The trademark application has been registered with the Office.
(Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Lawrence E. Abelman ABELMAN, FRAYNE & SCHWAB 666 THIRD AVENUE NEW YORK NY 10017-5621
Good, Services, and Codes
IC 009. US 021 023 026 036 038. G & S: [ Scanning probe microscopes, scanning electronic microscopes and atomic force microscopes; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for non-optical microscopes and optical near field microscopes; [ electric and electronic and micro-mechanical and micro-electromechanical instruments and apparatus for detection of pressure, gases, temperature, intensity of light, forces, acceleration, vibrations, nick angle, humidity, distances, speed, roughness, thickness, acoustic waves, and molecules for measuring surface topography, height, electrical and magnetical surface properties,potentials and currents, and for applying electromagnetic irradiation, temperatures, mechanical, electrical and magnetical forces, currents and potentials to a substrate; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for atomic force microscopy, for scanning probe microscopy, and for scanning electronic microscopy; electric and electronic and micro-mechanical and micro-electromechanical sensors comprised of micro-mechanical cantilevers and membranes
International Codes:
9
U.S. Codes:
021,023,026,036,038
Type Code
Type
GS0091
[ Scanning probe microscopes, scanning electronic microscopes and atomic force microscopes; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for non-optical microscopes and optical near field microscopes; [ electric and electronic and micro-mechanical and micro-electromechanical instruments and apparatus for detection of pressure, gases, temperature, intensity of light, forces, acceleration, vibrations, nick angle, humidity, distances, speed, roughness, thickness, acoustic waves, and molecules for measuring surface topography, height, electrical and magnetical surface properties,potentials and currents, and for applying electromagnetic irradiation, temperatures, mechanical, electrical and magnetical forces, currents and potentials to a substrate; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for atomic force microscopy, for scanning probe microscopy, and for scanning electronic microscopy; electric and electronic and micro-mechanical and micro-electromechanical sensors comprised of micro-mechanical cantilevers and membranes
Trademark Filing History
Description
Date
Proceeding Number
REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS)
2013-03-23
76533
REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED
2013-03-23
76533
NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - MAILED
2013-03-23
CASE ASSIGNED TO POST REGISTRATION PARALEGAL
2013-03-23
76533
TEAS SECTION 8 & 9 RECEIVED
2013-03-12
REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK.
2009-05-12
59807
ASSIGNED TO PARALEGAL
2009-05-07
59807
TEAS SECTION 8 & 15 RECEIVED
2009-05-05
CASE FILE IN TICRS
2008-07-22
REVIEW OF CORRESPONDENCE COMPLETE
2006-09-02
77315
PAPER RECEIVED
2006-08-21
REGISTERED-PRINCIPAL REGISTER
2003-06-10
PUBLISHED FOR OPPOSITION
2003-03-18
NOTICE OF PUBLICATION
2003-02-26
APPROVED FOR PUB - PRINCIPAL REGISTER
2003-01-22
Sec. 1(B) CLAIM DELETED
2002-12-13
76539
PAPER RECEIVED
2002-12-13
CORRESPONDENCE RECEIVED IN LAW OFFICE
2002-12-13
NON-FINAL ACTION MAILED
2002-06-19
ASSIGNED TO EXAMINER
2002-06-15
76147
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