Mark For: EMBEDDED PROCESS VERIFICATION™ trademark registration is intended to cover the categories of optical based measurement devices for use in ascertaining the surface features, contour, or shape of an object; optical sensors for high speed dimensional measurements of precision parts; optical sensors for use in the assembly of electronics; non-contact optical sensors for use in the assembly of electronics; solder paste inspection systems for inspecting and measuring solder paste on circuit boards and software there for, namely, optical sensors and associated computer hardware and software; non-contact inspection system comprised of a sensor with a light source, lenses and optical detectors for three dimensional measurement used during the manufacturing process of precision parts; machine vision system comprising component optical sensors and computer hardware and software; sensors for use in component placement and inspection systems; optical wafer mapping sensors for detecting wafers in wafer processing systems. [all]
Status
2022-08-03 UTC
DEAD APPLICATION Refused Dismissed or Invalidated
This trademark application was refused, dismissed, or invalidated by the Office and this application is no longer active.
(Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use
No
Current Use
No
Intent To Use
Yes
Filed ITU
Yes
44D Filed
No
44E Current
No
66A Current
No
Current Basis
No
No Basis
No
Attorney Name
JUDSON K. CHAMPLIN
Attorney Docket Number
C34.22-0015
Law Office Assigned
L30
Employee Name
KING, CHRISTINA B
Timeline
2002-02-07
Application Filed
2003-10-06
Abandon
2003-11-23
Status: Abandoned because the applicant failed to respond or filed a late response to an Office action. To view all documents in this fi
JUDSON K. CHAMPLIN WESTMAN, CHAMPLIN & KELLY, P.A. 900 2ND AVE., SOUTH, STE 1600 INTERNATIONAL CENTRE MINNEAPOLIS, MN 55402-3319
Good, Services, and Codes
(ABANDONED) IC 009. US 021 023 026 036 038. G & S: OPTICAL BASED MEASUREMENT DEVICES FOR USE IN ASCERTAINING THE SURFACE FEATURES, CONTOUR, OR SHAPE OF AN OBJECT; OPTICAL SENSORS FOR HIGH SPEED DIMENSIONAL MEASUREMENTS OF PRECISION PARTS; OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; NON-CONTACT OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; SOLDER PASTE INSPECTION SYSTEMS FOR INSPECTING AND MEASURING SOLDER PASTE ON CIRCUIT BOARDS AND SOFTWARE THERE FOR, NAMELY, OPTICAL SENSORS AND ASSOCIATED COMPUTER HARDWARE AND SOFTWARE; NON-CONTACT INSPECTION SYSTEM COMPRISED OF A SENSOR WITH A LIGHT SOURCE, LENSES AND OPTICAL DETECTORS FOR THREE DIMENSIONAL MEASUREMENT USED DURING THE MANUFACTURING PROCESS OF PRECISION PARTS; MACHINE VISION SYSTEM COMPRISING COMPONENT OPTICAL SENSORS AND COMPUTER HARDWARE AND SOFTWARE; SENSORS FOR USE IN COMPONENT PLACEMENT AND INSPECTION SYSTEMS; OPTICAL WAFER MAPPING SENSORS FOR DETECTING WAFERS IN WAFER PROCESSING SYSTEMS
International Codes:
9
U.S. Codes:
021,023,026,036,038
Type Code
Type
GS0091
OPTICAL BASED MEASUREMENT DEVICES FOR USE IN ASCERTAINING THE SURFACE FEATURES, CONTOUR, OR SHAPE OF AN OBJECT; OPTICAL SENSORS FOR HIGH SPEED DIMENSIONAL MEASUREMENTS OF PRECISION PARTS; OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; NON-CONTACT OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; SOLDER PASTE INSPECTION SYSTEMS FOR INSPECTING AND MEASURING SOLDER PASTE ON CIRCUIT BOARDS AND SOFTWARE THERE FOR, NAMELY, OPTICAL SENSORS AND ASSOCIATED COMPUTER HARDWARE AND SOFTWARE; NON-CONTACT INSPECTION SYSTEM COMPRISED OF A SENSOR WITH A LIGHT SOURCE, LENSES AND OPTICAL DETECTORS FOR THREE DIMENSIONAL MEASUREMENT USED DURING THE MANUFACTURING PROCESS OF PRECISION PARTS; MACHINE VISION SYSTEM COMPRISING COMPONENT OPTICAL SENSORS AND COMPUTER HARDWARE AND SOFTWARE; SENSORS FOR USE IN COMPONENT PLACEMENT AND INSPECTION SYSTEMS; OPTICAL WAFER MAPPING SENSORS FOR DETECTING WAFERS IN WAFER PROCESSING SYSTEMS
Trademark Filing History
Description
Date
Proceeding Number
ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE
2003-11-23
NON-FINAL ACTION MAILED
2003-04-03
PAPER RECEIVED
2002-12-16
CORRESPONDENCE RECEIVED IN LAW OFFICE
2002-12-16
NON-FINAL ACTION MAILED
2002-07-16
ASSIGNED TO EXAMINER
2002-05-28
68365
PAPER RECEIVED
2002-04-30
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