ENABLING THE PETA ERA

Mark For: ENABLING THE PETA ERA™ trademark registration is intended to cover the categories of micro-optical components, namely, lenses, ball lenses, lens arrays, mirrors, prisms, beam splitters, fiber optic arrays, collimators, collimator arrays for use in fiber optic applications and with arrayed wave guides; micro-ball lenses and micro-lenses for use in fiber optic applications and with arrayed wave guides; optical switches, optical filters, tunable optical filters; micro-optical assemblies, and fiber optic assemblies for use in optical networks; micro-optical modules for fiber optic networks and systems, micro-optic interferometers for use in the measurement of deviation of surface shape; distance measuring interferometers, namely laser heads, interferometers, processing electronics for use with the electronics board that processes electronic measurement signals generated by the photo detector; atmospheric insensitive distance measuring interferometers, namely laser heads, interferometers, processing electronics for use with the electronics board that processes electronic measurement signals generated by the photo detector; reticle critical dimension measuring equipment providing non-contaminated hands-off reticle measurement and inspection; in-process silicon wafer surface topography measuring equipment for use in precision measurement of silicon wafer topography; optical data storage heads and drives; surface metrology equipment for the measurement of magnetic rigid disk drive heads and sliders; and surface equipment for the measurement of magnetic rigid disk drive disks. [all]

Status

2022-09-21 UTC
⟳ Refresh

DEAD APPLICATION Refused Dismissed or Invalidated

Research	OneLook Acronym Finder
Serial Number	76162726
Mark Literal Elements	ENABLING THE PETA ERA
Mark Drawing Type	1 - TYPESET WORD(S) /LETTER(S) /NUMBER(S)
Mark Type	TRADEMARK
Standard Character Claim	No
Register	PRINCIPAL
Current Location	FILE REPOSITORY (FRANCONIA) 2003-05-29
Basis	1(b)
Class Status	ACTIVE
Primary US Classes	021: Electrical Apparatus, Machines and Supplies 023: Cutlery, Machinery, Tools and Parts Thereof 026: Measuring and Scientific Appliances 036: Musical Instruments and Supplies 038: Prints and Publications
Primary International Class	009 - Primary Class (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use	No
Current Use	No
Intent To Use	Yes
Filed ITU	Yes
44D Filed	No
44E Current	No
66A Current	No
Current Basis	No
No Basis	No
Attorney Name	John A Mizhir
Attorney Docket Number	09712-136001
Law Office Assigned	L30
Employee Name	ALI, STEPHANIE MARIE

Timeline

(ABANDONED)
IC 009. US 021 023 026 036 038. G & S: MICRO-OPTICAL COMPONENTS, NAMELY, LENSES, BALL LENSES, LENS ARRAYS, MIRRORS, PRISMS, BEAM SPLITTERS, FIBER OPT
IC ARRAYS, COLLIMATORS, COLLIMATOR ARRAYS FOR USE IN FIBER OPT
IC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; MICRO-BALL LENSES AND MICRO-LENSES FOR USE IN FIBER OPT
IC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; OPTICAL SWITCHES, OPTICAL FILTERS, TUNABLE OPTICAL FILTERS; MICRO-OPTICAL ASSEMBLIES, AND FIBER OPT
IC ASSEMBLIES FOR USE IN OPTICAL NETWORKS; MICRO-OPTICAL MODULES FOR FIBER OPT
IC NETWORKS AND SYSTEMS, MICRO-OPT
IC INTERFEROMETERS FOR USE IN THE MEASUREMENT OF DEVIATION OF SURFACE SHAPE; DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRON
IC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; ATMOSPHER
IC INSENSITIVE DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRON
IC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; RETICLE CRITICAL DIMENSION MEASURING EQUIPMENT PROVIDING NON-CONTAMINATED HANDS-OFF RETICLE MEASUREMENT AND INSPECTION; IN-PROCESS SILICON WAFER SURFACE TOPOGRAPHY MEASURING EQUIPMENT FOR USE IN PRECISION MEASUREMENT OF SILICON WAFER TOPOGRAPHY; OPTICAL DATA STORAGE HEADS AND DRIVES; SURFACE METROLOGY EQUIPMENT FOR THE MEASUREMENT OF MAGNET
IC RIGID DISK DRIVE HEADS AND SLIDERS; AND SURFACE EQUIPMENT FOR THE MEASUREMENT OF MAGNET
IC RIGID DISK DRIVE DISKS