EPIC
Nanometrics Incorporated
| Research |
OneLook
Acronym Finder
|
| Serial Number | 75486723 |
| Mark Drawing Code | 1000: Typeset: Word(s)/letter(s)/number(s) |
| Attorney Name | BRIAN FLYNN |
| Law Office Assigned | M40 |
| Employee Name | GILBERT, REBECCA L |
Timeline
| 1998-05-18 | Application Filed |
| 1999-11-15 | Abandon |
| 2000-02-29 | Status: Dead/Abandoned |
| 2000-03-03 | Location: FILE REPOSITORY (FRANCONIA) |
| 2018-07-08 | Transaction Date |
Trademark Applicants & Owners
| Owner: |  Nanometrics Incorporated |
| Address | 310 DeGuigne Drive Sunnyvale CA 94086 |
| Legal Entity Type | Corporation |
| Legal Entity State | CA |
Documents
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Attorney of Record
Good, Services, and Codes
| International Codes: | 9 |
| U.S. Codes: | 021,023,026,036,038 |
| Type Code | Type |
|---|---|
| GS0091 | metrology system for the analysis and determination of properties such as thickness and optical constants of films on samples such as semiconductor wafers using different optical technologies for film analysis such as Fourier Transform Infrared (FTIR), visible and ultraviolet (UV) reflectometry |
Trademark Filing History
| Description | Date | Event Coding |
|---|---|---|
| ASSIGNED TO EXAMINER | 1998-12-30 | 1 DOCK D:Assigned to Examiner |
| NON-FINAL ACTION MAILED | 1999-01-13 | 2 CNRT F:First Action |
| CORRESPONDENCE RECEIVED IN LAW OFFICE | 1999-03-22 | 3 CRFA I:Incoming Correspondence |
| FINAL REFUSAL MAILED | 1999-05-14 | 4 CNFR O:Outgoing Correspondence |
| ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | 2000-02-29 | 5 ABN2 O:Outgoing Correspondence |
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